Invention Grant
- Patent Title: Reducing measurement variation to optical measuring of sample material
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Application No.: US15787747Application Date: 2017-10-19
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Publication No.: US10794832B2Publication Date: 2020-10-06
- Inventor: Ville Laitala
- Applicant: WALLAC OY
- Applicant Address: FI Turku
- Assignee: WALLAC OY
- Current Assignee: WALLAC OY
- Current Assignee Address: FI Turku
- Agency: Nixon & Vanderhye
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@11af2766
- Main IPC: G01N21/75
- IPC: G01N21/75 ; G01N21/25 ; G01N1/28 ; G01N21/47 ; G01D18/00 ; G01N21/64

Abstract:
A measurement device includes mechanical support elements (101-104) for supporting a sample well, other mechanical support elements (105-109) for supporting a measurement head (112) suitable for optical measurements, and a control system (111) configured to control the measurement head to carry out at least two optical measurements from at least two different measurement locations inside the sample well, where each measurement location is a center point of a capture range from which radiation is captured in the respective optical measurement. The final measurement result is formed from the results of the at least two optical measurements in accordance with a pre-determined rule. The use of the at least two optical measurements from different measurement locations reduces measurement variation in situations where the sample well (153) contains a piece (158) of sample carrier.
Public/Granted literature
- US20180038801A1 REDUCING MEASUREMENT VARIATION TO OPTICAL MEASURING OF SAMPLE MATERIAL Public/Granted day:2018-02-08
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