Invention Grant
- Patent Title: Eddy current array probe with independent transmitters
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Application No.: US15303292Application Date: 2015-04-14
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Publication No.: US10794864B2Publication Date: 2020-10-06
- Inventor: Michäel Sirois , Stèfan Parmentier , Marc Grenier , Nathan Decourcelle
- Applicant: EddyFI NDT Inc.
- Applicant Address: CA Quèbec
- Assignee: EDDYFI NDT INC.
- Current Assignee: EDDYFI NDT INC.
- Current Assignee Address: CA Quèbec
- Agency: Bey & Cotropia PLLC
- Agent Dawn-Marie Bey
- International Application: PCT/IB2015/052722 WO 20150414
- International Announcement: WO2015/159226 WO 20151022
- Main IPC: G01N27/90
- IPC: G01N27/90

Abstract:
There is described an eddy current array probe for detection and depth sizing of a surface-breaking defect in a metallic material, said eddy current array probe comprising: a probe body comprising a plurality of probe elements arranged in a linear configuration, the probe elements each comprising at least one coil, the probe body being adapted to be displaced along a surface of the metallic material so that a longitudinal axis of the coil be parallel to the surface of the metallic material, the coil, when in use, being adapted to induce an eddy current within the metallic material detect the eddy current; and a set of active elements of the plurality of probe elements being adapted to be selectively operated at a plurality of time-spaced instances.
Public/Granted literature
- US20170030862A1 Eddy Current Array Probe With Independent Transmitters Public/Granted day:2017-02-02
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