A system for accurately determining an amount of electrical current flowing through a Hall effect current sensor is provided. The system includes a microcontroller that determines a smoothed electrical current offset value based on an average measured apparent electrical current value, an electrical current offset smoothing coefficient, a prior smoothed electrical current offset value, and a prior electrical current offset trend value. The microcontroller determines an electrical current offset trend value associated with the Hall effect current sensor based on the smoothed electrical current offset value, an electrical current offset trend smoothing coefficient, a prior smoothed electrical current offset value, and the prior electrical current offset trend value.