Invention Grant
- Patent Title: Method and apparatus for detecting low voltage defect of secondary battery
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Application No.: US16078532Application Date: 2018-01-03
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Publication No.: US10794960B2Publication Date: 2020-10-06
- Inventor: Sung-Tae Kim , Joon-Sung Bae , Nak-Gi Sung
- Applicant: LG CHEM, LTD.
- Applicant Address: KR Seoul
- Assignee: LG CHEM, LTD.
- Current Assignee: LG CHEM, LTD.
- Current Assignee Address: KR Seoul
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@3c0b2ff0
- International Application: PCT/KR2018/000135 WO 20180103
- International Announcement: WO2018/128395 WO 20180712
- Main IPC: G01R31/385
- IPC: G01R31/385 ; H01M10/42 ; G01R31/388 ; H01M10/48 ; H01M10/44 ; G01R31/36 ; H01M10/0525 ; H01M10/04

Abstract:
Disclosed is a technique for effectively detecting a low voltage defect that may occur at a secondary battery.A method for detecting a low voltage defect of a secondary battery includes an assembling step of assembling a secondary battery by accommodating an electrode assembly, in which a positive electrode plate and a negative electrode plate are stacked with a separator being interposed therebetween, and an electrolytic solution in a battery case; a primary aging step of aging the assembled secondary battery at a temperature of 20° C. to 40° C.; a primary formation step of charging the aged secondary battery at a C-rate of 0.1 C to 0.5 C; a high-rate charging step of charging the secondary battery at a C-rate of 2 C or above, after the primary formation step; and a detecting step of detecting a defect of the secondary battery, after the high-rate charging step.
Public/Granted literature
- US20190033380A1 METHOD AND APPARATUS FOR DETECTING LOW VOLTAGE DEFECT OF SECONDARY BATTERY Public/Granted day:2019-01-31
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