Invention Grant
- Patent Title: Device and method for determining a parameter of a transformer
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Application No.: US15548950Application Date: 2016-01-26
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Publication No.: US10794964B2Publication Date: 2020-10-06
- Inventor: Markus Pütter , Bernd Marte
- Applicant: OMICRON ELECTRONICS GMBH
- Applicant Address: AT Klaus
- Assignee: OMICRON ELECTRONICS GMBH
- Current Assignee: OMICRON ELECTRONICS GMBH
- Current Assignee Address: AT Klaus
- Agency: Mintz Levin Cohn Ferris Glovsky and Popeo, P.C.
- Agent Peter F. Corless; Steven M. Jensen
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@670fe81b
- International Application: PCT/EP2016/051544 WO 20160126
- International Announcement: WO2016/124443 WO 20160811
- Main IPC: G01R31/62
- IPC: G01R31/62 ; G01R27/26 ; G01R29/20

Abstract:
To ascertain a parameter of a transformer (40) that has a high voltage side (41) and a low voltage side (43), a test signal generated by a source (13) is impressed on the low voltage side (43). A test response of the transformer (40) is recorded. A leakage reactance and/or a leakage inductance of the transformer (40) is determined by an evaluation device (18) of an apparatus (10) on the basis of the test response of the transformer (40).
Public/Granted literature
- US20180024180A1 DEVICE AND METHOD FOR DETERMINING A PARAMETER OF A TRANSFORMER Public/Granted day:2018-01-25
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