Invention Grant
- Patent Title: Automated system and methodology for feature extraction
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Application No.: US16548219Application Date: 2019-08-22
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Publication No.: US10796189B2Publication Date: 2020-10-06
- Inventor: Yandong Wang , Frank Giuffrida
- Applicant: Pictometry International Corp.
- Applicant Address: US NY Rochester
- Assignee: Pictometry International Corp.
- Current Assignee: Pictometry International Corp.
- Current Assignee Address: US NY Rochester
- Agency: Dunlap Codding, P.C.
- Main IPC: G06K9/46
- IPC: G06K9/46 ; G06K9/00 ; G06K9/62 ; G06T7/50 ; G06T7/73

Abstract:
Automated methods and systems for feature extraction are disclosed, including automated methods performed by at least one processor running computer executable instructions stored on at least one non-transitory computer readable medium, comprising determining and isolating an object of interest within a point cloud; forming a modified point cloud having one or more data points with first location coordinates of the object of interest; and generating a boundary outline having second location coordinates of the object of interest using spectral analysis of at least one section of at least one image identified with the first location coordinates and depicting the object of interest.
Public/Granted literature
- US20190377966A1 AUTOMATED SYSTEM AND METHODOLOGY FOR FEATURE EXTRACTION Public/Granted day:2019-12-12
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