Invention Grant
- Patent Title: Fault diagnosis apparatus, fault diagnosis method, and fault diagnosis program
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Application No.: US15909180Application Date: 2018-03-01
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Publication No.: US10796796B2Publication Date: 2020-10-06
- Inventor: Mizuki Takei
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Studebaker & Brackett PC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@3bf8af8
- Main IPC: G06F11/30
- IPC: G06F11/30 ; G16H40/40 ; G05B23/02

Abstract:
A fault diagnosis apparatus acquires, by using an acquisition unit, for each of a plurality of medical devices, installation environment information including a plurality of items about an installation environment in which each of the plurality of medical devices is installed; classifies, by using a classification unit, the plurality of medical devices into a plurality of groups on the basis of the installation environment information; extracts, by using an extraction unit, an item in the installation environment information representing a feature of a group to which a device in which a fault has occurred among the plurality of medical devices belongs, the feature being different from that of the other groups; and performs control, by using a display control unit, to cause a display unit to display an extraction result obtained by the extraction unit.
Public/Granted literature
- US20180190378A1 FAULT DIAGNOSIS APPARATUS, FAULT DIAGNOSIS METHOD, AND FAULT DIAGNOSIS PROGRAM Public/Granted day:2018-07-05
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