Invention Grant
- Patent Title: System and method for testing photosensitive device degradation
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Application No.: US15989530Application Date: 2018-05-25
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Publication No.: US10797641B2Publication Date: 2020-10-06
- Inventor: Michael D. Irwin , Jerome Lovelace , Kamil Mielczarek
- Applicant: HEE Solar, L.L.C.
- Applicant Address: US TX Dallas
- Assignee: Hunt Perovskite Technologies, LLC
- Current Assignee: Hunt Perovskite Technologies, LLC
- Current Assignee Address: US TX Dallas
- Agency: Baker Botts L.L.P.
- Main IPC: H02S99/00
- IPC: H02S99/00 ; H02S50/15 ; H02S50/10

Abstract:
The performance of photosensitive devices over time may be tested by configuring a photosensitive device test system that includes a light source plate that exposes photosensitive devices within a container to a specified light intensity. The light intensity may be adjusted by a programmable power source according to one or more thresholds. A test may last for a set duration with performance measurements being taken at predetermined intervals throughout the duration. Feedback from the photosensitive device test system may be recorded to determine whether to increase light intensity, to stop testing, to continue testing, and whether one or more environmental conditions should be altered. Measurements may be sent to a client for analysis and display to a user.
Public/Granted literature
- US20180278208A1 SYSTEM AND METHOD FOR TESTING PHOTOSENSITIVE DEVICE DEGRADATION Public/Granted day:2018-09-27
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