Invention Grant
- Patent Title: Compensating for degradation of electronics due to radiation vulnerable components
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Application No.: US15861528Application Date: 2018-01-03
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Publication No.: US10797701B2Publication Date: 2020-10-06
- Inventor: Zygmunt Zubkow , Richard Wessels , John Lintz
- Applicant: Honeywell International Inc.
- Applicant Address: US NJ Morris Plains
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NJ Morris Plains
- Agency: Shumaker & Sieffert, P.A.
- Main IPC: G06F11/14
- IPC: G06F11/14 ; H03K19/003 ; G01T1/02 ; H01L31/119

Abstract:
Techniques to compensate non-radiation hardened components for changes or degradation in performance that result from exposure to radiation. During testing and modeling phase, a component's performance may be characterized as a result of the exposure to radiation. In some examples, some performance characteristics, such as voltage response, frequency response, gain, leakage or other characteristics, may change as the component's exposure to an amount of radiation increases. During normal operation, a system may include one or more devices that measure the amount of radiation to which the system may be subjected, such as a radiation dosimeter. The system may compensate the non-radiation hardened component based on the amount of radiation received the known component performance change caused by radiation as determined during the modeling phase.
Public/Granted literature
- US20190207606A1 COMPENSATING FOR DEGRADATION OF ELECTRONICS DUE TO RADIATION VULNERABLE COMPONENTS Public/Granted day:2019-07-04
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