Invention Grant
- Patent Title: Method and apparatus for analyzing phase noise in a signal from an electronic device
-
Application No.: US16210229Application Date: 2018-12-05
-
Publication No.: US10802074B2Publication Date: 2020-10-13
- Inventor: Gary Giust
- Applicant: JitterLabs LLC
- Applicant Address: US CA Santa Clara
- Assignee: JITTERLABS LLC
- Current Assignee: JITTERLABS LLC
- Current Assignee Address: US CA Santa Clara
- Agency: Tysver Beck Evans
- Main IPC: G01R31/317
- IPC: G01R31/317

Abstract:
An apparatus and method for analyzing phase noise in a signal. A plurality of signal samples, each signal sample representing a value of phase noise in a signal-under-test at a corresponding offset frequency, and filter data representing filter characteristics on a first side of a spectrum boundary, are used to derive filtered signal samples. A measure of noise is derived from the filtered signal samples. This abstract is not to be considered limiting, since other embodiments may deviate from the features described in this abstract.
Public/Granted literature
- US20190204386A1 Method and Apparatus for Analyzing Phase Noise in a Signal From an Electronic Device Public/Granted day:2019-07-04
Information query