Invention Grant
- Patent Title: Measuring device, measuring method, and programs therefor
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Application No.: US16452571Application Date: 2019-06-26
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Publication No.: US10802145B2Publication Date: 2020-10-13
- Inventor: Hiroki Nagashima , Atsushi Shoji , Akira Oide
- Applicant: TOPCON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOPCON CORPORATION
- Current Assignee: TOPCON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Xsensus LLP
- Main IPC: G01S17/42
- IPC: G01S17/42 ; G06T17/00

Abstract:
A technique for efficiently performing operations for identifying a current position in a method of measuring electromagnetic waves is provided. A measuring device includes a measurement planned position data receiving unit 302, a current position data receiving unit 303, and a GUI controlling unit 306. The measurement planned position data receiving unit 302 receives data of measurement planned positions at each of which electromagnetic waves are measured. The current position data receiving unit 303 receives data of a current position of an electromagnetic wave measuring device. The GUI controlling unit 306 controls displaying of a relationship between the current position of the electromagnetic wave measuring device and the measurement planned position on a display based on data of the measurement planned positions and data of the current position.
Public/Granted literature
- US20190317215A1 MEASURING DEVICE, MEASURING METHOD, AND PROGRAMS THEREFOR Public/Granted day:2019-10-17
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