Invention Grant
- Patent Title: System and method for checking and characterizing snapshot metadata using snapshot metadata database
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Application No.: US15354984Application Date: 2016-11-17
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Publication No.: US10802927B2Publication Date: 2020-10-13
- Inventor: Cheng Li , Li Ding , Bret Needle , Mayank Rawat
- Applicant: VMware, Inc.
- Applicant Address: US CA Palo Alto
- Assignee: VMware, Inc.
- Current Assignee: VMware, Inc.
- Current Assignee Address: US CA Palo Alto
- Agency: Loza & Loza, LLP
- Main IPC: G06F16/00
- IPC: G06F16/00 ; G06F11/14 ; G06F16/11
Abstract:
System and method for checking and characterizing metadata of snapshots utilize a snapshot metadata database to execute at least one of checking and characterizing operations on the metadata of snapshots. The snapshot metadata database includes information extracted from backing storage elements containing the metadata of snapshots.
Public/Granted literature
- US20180137014A1 SYSTEM AND METHOD FOR CHECKING AND CHARACTERIZING SNAPSHOT METADATA USING SNAPSHOT METADATA DATABASE Public/Granted day:2018-05-17
Information query
