Invention Grant
- Patent Title: Determining defects having a characteristic separation distance
-
Application No.: US16346318Application Date: 2017-01-20
-
Publication No.: US10805477B2Publication Date: 2020-10-13
- Inventor: Oren Haik , Oded Perry , Avi Malki
- Applicant: HP Indigo B.V.
- Applicant Address: NL Amstelveen
- Assignee: HP Indigo B.V.
- Current Assignee: HP Indigo B.V.
- Current Assignee Address: NL Amstelveen
- Agent Michael A Dryja
- International Application: PCT/EP2017/051194 WO 20170120
- International Announcement: WO2018/133944 WO 20180726
- Main IPC: H04N1/00
- IPC: H04N1/00
Abstract:
In an example, a method includes determining, by a processor, at least one separation distance between defects in a scanned image of a printed substrate sheet bearing a printed image, wherein the separation distance determined in a predetermined direction. The method may further comprise determining, by the processor, if the defects have a characteristic separation distance.
Public/Granted literature
- US20190335041A1 DETERMINING DEFECTS HAVING A CHARACTERISTIC SEPARATION DISTANCE Public/Granted day:2019-10-31
Information query
