Invention Grant
- Patent Title: Synchronized safe data commit scans in multiple data storage systems
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Application No.: US15913735Application Date: 2018-03-06
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Publication No.: US10809938B2Publication Date: 2020-10-20
- Inventor: Lokesh M. Gupta , Matthew G. Borlick , Roger G. Hathorn
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Konrad, Raynes, Davda and Victor LLP
- Agent William K. Konrad
- Main IPC: G06F12/00
- IPC: G06F12/00 ; G06F3/06

Abstract:
In one aspect of the present description, safe data commit scan operations of individual data storage systems of a distributed data storage system may be synchronized to reduce the occurrence of reductions in input/output (I/O) response times. In one embodiment, a set of safe data commit scan operations of the individual data storage systems of a distributed data storage system are synchronously timed to substantially overlap in time within a single synchronized safe data commit scan set interval to reduce or eliminate the occurrences of reductions in input/output response times outside the synchronized safe data commit scan set interval. Other features and aspects may be realized, depending upon the particular application.
Public/Granted literature
- US20190278481A1 SYNCHRONIZED SAFE DATA COMMIT SCANS IN MULTIPLE DATA STORAGE SYSTEMS Public/Granted day:2019-09-12
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