Invention Grant
- Patent Title: Sample test automation system
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Application No.: US15664343Application Date: 2017-07-31
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Publication No.: US10816564B2Publication Date: 2020-10-27
- Inventor: Takahiro Sasaki , Kenichi Takahashi , Hiroshi Ohga , Tatsuya Fukugaki , Shigeru Yano , Kenichi Yasuzawa , Nozomi Hasegawa , Masaaki Hanawa
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@3f42945f com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@58452dad com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@2085ef3c
- Main IPC: G01N35/02
- IPC: G01N35/02 ; G01N35/00

Abstract:
A sample test automation system which is capable of reducing the workload of an operator and precisely carrying out necessary processes of each of samples without stagnation. In the sample test automation system, a sample tray 120 on which a plurality of samples 150 can be installed is prepared, an identifier for distinguishing the sample tray 120 is attached to the sample tray 120, a sample introducing unit 10 is provided with an identifier reading apparatus 111 which reads the identifier of the sample tray 120, and information about the samples 150 is switched based on the read identifier of the sample tray 120.
Public/Granted literature
- US20170328926A1 SAMPLE TEST AUTOMATION SYSTEM Public/Granted day:2017-11-16
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