Invention Grant
- Patent Title: Measuring system
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Application No.: US15666050Application Date: 2017-08-01
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Publication No.: US10816611B2Publication Date: 2020-10-27
- Inventor: Timo Kaufmann , Joerg Franke
- Applicant: TDK—Micronas GmbH
- Applicant Address: DE Freiburg
- Assignee: TDK-Micronas GmbH
- Current Assignee: TDK-Micronas GmbH
- Current Assignee Address: DE Freiburg
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@4fb91d83
- Main IPC: G01R33/00
- IPC: G01R33/00 ; G01B7/02 ; G01R33/02 ; G01R33/07 ; G01R33/038 ; G01R33/38 ; G01D5/14

Abstract:
A measuring system having a magnetic device for generating a magnetic field and at least one magnetic field sensor for detecting a flux density of the magnetic field, at least in a first spatial direction. The magnetic device has a top side facing the magnetic field sensor, the magnetic field sensor is spaced apart from the top side of the magnetic device, the magnetic device has a main magnet, having two poles, with a main magnetizing direction for generating a main magnetic field and at least one secondary magnet, having two poles, with a secondary magnetization direction for generating a secondary magnetic field, the main magnet has larger dimensions than the at least one secondary magnet, the magnetic field is formed by superposition of the main magnetic field and the secondary magnetic field, the secondary magnetic field at least partially compensates the main magnetic field in the first spatial direction.
Public/Granted literature
- US20180031643A1 MEASURING SYSTEM Public/Granted day:2018-02-01
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