This manufacturing facility management optimization device: on the basis of an operation condition of a manufacturing facility, creates, in a simulated manner in time series, an operation state which includes a measurement value, product yield, and quantities of raw materials consumed, of the manufacturing facility; detects an anomaly from the created operation state; identifies maintenance which corresponds to the detected anomaly, corrects the operation condition on the basis of the identified maintenance, and creates a plurality of post-correction operation condition candidates; creates, in a simulated manner in time series, a plurality of post-correction operation state candidates on the basis of the plurality of post-correction operation condition candidates; on the basis of the product yield and the quantities of raw materials consumed in the plurality of pre- and post-correction operation state candidates, and a unit price, creates a management index for the operation state and each of the plurality of post-correction operation state candidates; and, from among the plurality of post-correction operation condition candidates, identifies the candidate which optimizes the management index.