Invention Grant
- Patent Title: Apparatus and methods for debugging on a memory device
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Application No.: US16140882Application Date: 2018-09-25
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Publication No.: US10817360B2Publication Date: 2020-10-27
- Inventor: Perry V. Lea , Shawn Rosti
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07 ; G06F11/36 ; G11C11/4096 ; G11C11/4091 ; G11C29/00 ; G11C11/408 ; G11C7/10 ; G11C7/06 ; G11C11/4076 ; G11C11/4093

Abstract:
The present disclosure includes apparatus and methods for debugging on a memory device. An example apparatus comprises a memory device having an array of memory cells and sensing circuitry coupled to the array. The sensing circuitry includes a sense amplifier and a compute component configured to perform logical operations on the memory device. A controller is coupled to the array and sensing circuitry and configured to cause the memory device to store debugging code in the array of memory cells and execute instructions to perform logical operations using the sensing circuitry. The controller is further configured to receive an indication in the executing instructions to halt a logical operation, and to execute the debugging code on the memory device.
Public/Granted literature
- US20190026171A1 APPARATUS AND METHODS FOR DEBUGGING ON A MEMORY DEVICE Public/Granted day:2019-01-24
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