Invention Grant
- Patent Title: Method and apparatus for tracing common cause failure in integrated drawing
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Application No.: US16414662Application Date: 2019-05-16
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Publication No.: US10817366B2Publication Date: 2020-10-27
- Inventor: Ho Bin Yim , Jae Young Huh , Gyu Cheon Lee
- Applicant: KEPCO ENGINEERING & CONSTRUCTION COMPANY, INC.
- Applicant Address: KR Gyeongsangbuk-do
- Assignee: KEPCO ENGINEERING & CONSTRUCTION COMPANY, INC.
- Current Assignee: KEPCO ENGINEERING & CONSTRUCTION COMPANY, INC.
- Current Assignee Address: KR Gyeongsangbuk-do
- Agency: Schwabe, Williamson & Wyatt, P.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@52b92856 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@285e1432
- Main IPC: G06F11/07
- IPC: G06F11/07 ; G06F11/32 ; G06F11/34 ; G06K9/32 ; G06F16/901

Abstract:
Provided is a method of tracing a common cause failure in an integrated drawing. The method includes: synthesizing entities assigned attributes in at least one design drawing in units of a system where a common cause is to be traced; generating an integrated drawing with a hierarchical structure by horizontally or vertically interconnecting the entities assigned the same attribute in the at least one design drawing; and displaying a fault propagation path in the integrated drawing by using an internal tracer, wherein the displaying illustrates state information of the entities on the fault propagation path.
Public/Granted literature
- US20190354459A1 METHOD AND APPARATUS FOR TRACING COMMON CAUSE FAILURE IN INTEGRATED DRAWING Public/Granted day:2019-11-21
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