Invention Grant
- Patent Title: Methods for determining misalignment of X-ray detectors
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Application No.: US16117867Application Date: 2018-08-30
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Publication No.: US10820882B2Publication Date: 2020-11-03
- Inventor: Peiyan Cao , Yurun Liu
- Applicant: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Applicant Address: CN Shenzhen
- Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Current Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Shenzhen
- Agency: IPro, PLLC
- Main IPC: A61B6/00
- IPC: A61B6/00

Abstract:
Disclosed herein is a method comprising: obtaining a third image from a first X-ray detector when the first X-ray detector and a second X-ray detector are misaligned; determining, based on a shift between a first image and the third image, a misalignment between the first X-ray detector and the second X-ray detector when the first and second detectors are misaligned; wherein the first image is an image the first X-ray detector should capture if the first and the second detectors are aligned.
Public/Granted literature
- US20190015068A1 Methods for Determining Misalignment of X-ray Detectors Public/Granted day:2019-01-17
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