Invention Grant
- Patent Title: Quality control system and quality control method
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Application No.: US16324116Application Date: 2017-06-30
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Publication No.: US10822171B2Publication Date: 2020-11-03
- Inventor: Kohhei Aida , Masahiro Kawasaki , Shunsuke Mori , Hiroshi Sasaki , Yuya Tokuda
- Applicant: HITACHI, LTD.
- Applicant Address: JP Tokyo
- Assignee: HITACHI, LTD.
- Current Assignee: HITACHI, LTD.
- Current Assignee Address: JP Tokyo
- Agency: Volpe Koenig
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@df7c5ab
- International Application: PCT/JP2017/024098 WO 20170630
- International Announcement: WO2018/030025 WO 20180215
- Main IPC: B65G1/137
- IPC: B65G1/137 ; B65G61/00 ; G06Q10/08 ; G06Q50/28

Abstract:
A quality control system includes a control device, an output device, and an input device placed at at least an end point of a distribution channel of articles; the input device includes an input unit for receiving data on a changed environment portion and a communication unit that transmits the data, information about an input location, and an input time to the control device. The control device includes a storage unit for storing the mode of packing of the articles in the distribution channel, a reception unit for receiving the information from the input device, an arithmetic operation unit that calculates the number of articles deviating from the storage environment and estimates the stage of the distribution channel deviating from the storage environment, and a transmission unit for transmitting calculation result to the output device that is provided with a display unit.
Public/Granted literature
- US20190210806A1 QUALITY CONTROL SYSTEM AND QUALITY CONTROL METHOD Public/Granted day:2019-07-11
Information query
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