Invention Grant
- Patent Title: Built-in S-typed array eddy current testing probe and method for detecting defects of tubular structure
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Application No.: US16634574Application Date: 2019-03-20
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Publication No.: US10823702B2Publication Date: 2020-11-03
- Inventor: Zhenmao Chen , Yingsong Zhao , Shejuan Xie , Hongen Chen , Xiaojie Yu
- Applicant: XI'AN JIAOTONG UNIVERSITY
- Applicant Address: CN Xi'an, Shaanxi
- Assignee: XI'AN JIAOTONG UNIVERSITY
- Current Assignee: XI'AN JIAOTONG UNIVERSITY
- Current Assignee Address: CN Xi'an, Shaanxi
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1597b927
- International Application: PCT/CN2019/080689 WO 20190320
- International Announcement: WO2019/205891 WO 20191031
- Main IPC: G01N27/82
- IPC: G01N27/82 ; G01N27/90

Abstract:
A built-in S-typed array eddy current testing probe and a method for detecting defects of a tubular structure are provided. The probe includes an exciting coil part and a plurality of pick-up coil parts, wherein: the exciting coil part includes multiple bundles of exciting coil wires helically wound on a columnar coil former with a same interval; two bundles of exciting coil wires with an interval of 180° are connected at an end of the columnar coil former, actually being a same group of exciting coil wire bundles; each pick-up coil part consists of two rows of pancake coils; each four pancake coils which are closely arranged in a square shape form one differential eddy current testing pick-up unit; a final output signal is a result of additions between signals of opposite pancake coils and subtractions between signals of adjacent pancake coils in each differential eddy current testing pick-up unit.
Public/Granted literature
- US20200271622A1 Built-in S-typed array eddy current testing probe and method for detecting defects of tubular structure Public/Granted day:2020-08-27
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