Invention Grant
- Patent Title: Lithographic mask layer
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Application No.: US15813913Application Date: 2017-11-15
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Publication No.: US10824078B2Publication Date: 2020-11-03
- Inventor: Roel Gronheid , Arjun Singh , Werner Knaepen
- Applicant: IMEC VZW , Katholieke Universiteit Leuven, KU LEUVEN R&D
- Applicant Address: BE Leuven BE Leuven
- Assignee: Imec vzw,Katholieke Universiteit Leuven
- Current Assignee: Imec vzw,Katholieke Universiteit Leuven
- Current Assignee Address: BE Leuven BE Leuven
- Agency: McDonnell Boehnen Hulbert & Berghoff LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@77306a9c
- Main IPC: G03F7/20
- IPC: G03F7/20 ; G03F7/42 ; G03F7/004 ; G03F7/40 ; G03F7/38 ; G03F7/00 ; G03F7/09

Abstract:
An example embodiment relates to a method for making a mask layer. The method may include providing a patterned layer on a substrate, the patterned layer including at least a first set of lines of an organic material of a first nature, the lines having a line height, a first line width roughness, and being separated either by voids or by a material of a second nature. The method may further include infiltrating at least a top portion of the first set of lines with a metal or ceramic material. The method may further include removing the organic material by oxidative plasma etching, thereby forming a second set of lines of metal or ceramic material on the substrate, the second set of lines having a second line width roughness, smaller than the first line width roughness.
Public/Granted literature
- US20180173109A1 Lithographic Mask Layer Public/Granted day:2018-06-21
Information query
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