Invention Grant
- Patent Title: Selective growth of SIO2 on dielectric surfaces in the presence of copper
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Application No.: US16575214Application Date: 2019-09-18
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Publication No.: US10825679B2Publication Date: 2020-11-03
- Inventor: Dennis M. Hausmann , Alexander R. Fox , Colleen Lawlor
- Applicant: Lam Research Corporation
- Applicant Address: US CA Fremont
- Assignee: Lam Research Corporation
- Current Assignee: Lam Research Corporation
- Current Assignee Address: US CA Fremont
- Agency: Weaver Austin Villeneuve & Sampson LLP
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L21/67 ; C23C16/455 ; C23C16/52 ; C23C16/40 ; C23C16/50 ; H01L21/768 ; H01L21/321 ; H01L21/32

Abstract:
Methods and apparatuses for selectively depositing silicon oxide on surfaces relative to a metal-containing surface such as copper are provided. Methods involve exposing a substrate having hydroxyl-terminated or dielectric surfaces and copper surfaces to a copper-blocking reagent such as an alkyl thiol to selectively adsorb to the copper surface, exposing the substrate to a silicon-containing precursor for depositing silicon oxide, exposing the substrate to a weak oxidant gas and igniting a plasma, or water vapor without plasma, to convert the adsorb silicon-containing precursor to form silicon oxide. Some methods also involve exposing the substrate to a reducing agent to reduce any oxidized copper from exposure to the weak oxidant gas.
Public/Granted literature
- US20200013615A1 SELECTIVE GROWTH OF SIO2 ON DIELECTRIC SURFACES IN THE PRESENCE OF COPPER Public/Granted day:2020-01-09
Information query
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