Invention Grant
- Patent Title: Inspection method, inspection and reporting method, manufacturing method including the inspection method, inspection apparatus, and manufacturing apparatus
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Application No.: US16316168Application Date: 2017-06-16
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Publication No.: US10830707B2Publication Date: 2020-11-10
- Inventor: Kenzo Yasue
- Applicant: YOSHINO GYPSUM CO., LTD.
- Applicant Address: JP Tokyo
- Assignee: YOSHINO GYPSUM CO., LTD.
- Current Assignee: YOSHINO GYPSUM CO., LTD.
- Current Assignee Address: JP Tokyo
- Agency: IPUSA, PLLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@5b558dfc
- International Application: PCT/JP2017/022279 WO 20170616
- International Announcement: WO2018/012192 WO 20180118
- Main IPC: G01N21/898
- IPC: G01N21/898
Abstract:
An inspection method for inspecting a board-shaped inspection object with a pattern includes an imaging step of capturing an original image of an inspection surface of the inspection object, a digitization step of generating an image with two or three gradation levels by digitizing the original image captured by the imaging step using a threshold, and a determination step of inspecting the inspection object using the image generated by the digitization step.
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