Invention Grant
- Patent Title: X-ray inspection apparatus
-
Application No.: US16356903Application Date: 2019-03-18
-
Publication No.: US10830711B2Publication Date: 2020-11-10
- Inventor: Shingo Kondo
- Applicant: ISHIDA CO., LTD.
- Applicant Address: JP Kyoto
- Assignee: ISHIDA CO., LTD.
- Current Assignee: ISHIDA CO., LTD.
- Current Assignee Address: JP Kyoto
- Agency: Global IP Counselors, LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@6b67493f
- Main IPC: G01N23/04
- IPC: G01N23/04 ; H05G1/02 ; G01T7/00 ; G01V5/00
Abstract:
An X-ray inspection apparatus includes: an X-ray emitter configured to emit an X-ray; an X-ray detector configured to detect the X-ray; a first flow passage configured to guide air to at least part of the X-ray detector; and a second flow passage configured to guide air to at least part of the X-ray detector.
Public/Granted literature
- US20190297717A1 X-RAY INSPECTION APPARATUS Public/Granted day:2019-09-26
Information query
