Invention Grant
- Patent Title: Fault analysis method and apparatus based on data center
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Application No.: US15638109Application Date: 2017-06-29
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Publication No.: US10831630B2Publication Date: 2020-11-10
- Inventor: Feng Wang
- Applicant: Huawei Technologies Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: Huawei Technologies Co., Ltd.
- Current Assignee: Huawei Technologies Co., Ltd.
- Current Assignee Address: CN Shenzhen
- Agency: Slater Matsil, LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@2194dcf8
- Main IPC: G06F11/30
- IPC: G06F11/30 ; H04L12/24 ; G01R31/08 ; H02H7/26

Abstract:
Embodiments of the present invention disclose a fault analysis method based on a data center. The method includes obtaining a topology structure diagram, where nodes in the topology structure diagram include component devices of the data center and a virtual machine running on the data center. The method also includes, when a fault occurs in the data center, obtaining a fault alarm and determining, according to the topology structure diagram, whether the fault reduces communications paths between virtual machines in a virtual machine group running on the data center.
Public/Granted literature
- US20170299645A1 Fault Analysis Method and Apparatus Based on Data Center Public/Granted day:2017-10-19
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