Invention Grant
- Patent Title: Scan test control decoder with storage elements for use within integrated circuit (IC) devices having limited test interface
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Application No.: US16460405Application Date: 2019-07-02
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Publication No.: US10852353B1Publication Date: 2020-12-01
- Inventor: Mudasir Shafat Kawoosa , Vishal Diwan
- Applicant: TEXAS INSTRUMENTS INCORPORATED
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Ebby Abraham; Charles A. Brill; Frank D. Cimino
- Main IPC: G01R31/3177
- IPC: G01R31/3177 ; G01R31/317 ; G01R31/3183 ; G01R31/3185
Abstract:
An integrated circuit (IC) includes logic components and a scan test circuit coupled to the logic components. The IC also includes a scan input pin coupled to the scan test circuit. The IC also includes a scan input/output pin coupled to the scan test circuit. The scan test circuit includes a decoder coupled to at least one of the scan input pin and the scan input/output pin. The decoder includes storage elements configured to store different scan control signals and to output at least one of the different scan control signals in response to a master control signal.
Information query
