Invention Grant
- Patent Title: Apparatus and method for detecting poor component life zones in a datacenter
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Application No.: US16045326Application Date: 2018-07-25
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Publication No.: US10853222B2Publication Date: 2020-12-01
- Inventor: Vaideeswaran Ganesan , Pravin Janakiram , Chandrasekhar Revuri
- Applicant: DELL PRODUCTS, LP
- Applicant Address: US TX Round Rock
- Assignee: Dell Products, L.P.
- Current Assignee: Dell Products, L.P.
- Current Assignee Address: US TX Round Rock
- Agency: Larson Newman, LLP
- Main IPC: G06F11/34
- IPC: G06F11/34 ; H04L12/26 ; G06F17/18 ; G06F11/30

Abstract:
An information handling system determines zones within a datacenter that exhibit poor component life. Components of the information handling system are organized into zones, and provide error indications and have error thresholds and warranty durations. A component life manager receives the error indications, fits the error indications to curves, determines end of life estimates based upon the curves and the error thresholds, determines end of life dates based upon the end of life estimates and dates that the first error indication is received, determines losses of life based on the end of life estimates and the warranty durations, determines component life scores based upon the losses of life and the warranty durations, determines zone life scores based upon an average of the component life scores, determines a datacenter life score based upon an average of the component life scores, and provides an indication when a zone life score is below the datacenter life score by more than a threshold.
Public/Granted literature
- US20200034268A1 Apparatus and Method for Detecting Poor Component Life Zones in a Datacenter Public/Granted day:2020-01-30
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