Invention Grant
- Patent Title: Integrated circuits for generating input/output latency performance metrics using real-time clock (RTC) read measurement module
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Application No.: US16445500Application Date: 2019-06-19
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Publication No.: US10853283B1Publication Date: 2020-12-01
- Inventor: Garrett Matthias Drown , Patrick Lu
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Trop, Pruner & Hu, P.C.
- Main IPC: G06F13/20
- IPC: G06F13/20 ; G06F9/30 ; G06F13/12 ; G06F3/00

Abstract:
An integrated circuit includes technology for generating input/output (I/O) latency metrics. The integrated circuit includes a real-time clock (RTC), a read measurement register, and a read latency measurement module. The read latency measurement module includes control logic to perform operations comprising (a) in response to receipt of read responses that complete read requests associated with an I/O device, automatically calculating read latencies for the completed read requests, based at least in part on time measurements from the RTC for initiation and completion of the read requests; (b) automatically calculating an average read latency for the completed read requests, based at least in part on the calculated read latencies for the completed read requests; and (c) automatically updating the read measurement register to record the average read latency for the completed read requests. Other embodiments are described and claimed.
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