Invention Grant
- Patent Title: Etching method, method of manufacturing semiconductor chip, and method of manufacturing article
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Application No.: US16267456Application Date: 2019-02-05
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Publication No.: US10854466B2Publication Date: 2020-12-01
- Inventor: Keiichiro Matsuo , Susumu Obata , Mitsuo Sano , Kazuhito Higuchi , Kazuo Shimokawa
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Minato-ku
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2018-021849 20180209
- Main IPC: H01L21/308
- IPC: H01L21/308 ; H01L21/768 ; H01L21/033

Abstract:
An etching method according to an embodiment includes forming an uneven structure including a projection on a surface of a semiconductor substrate; forming a catalyst layer including a noble metal on the surface selectively at a top surface of the projection; and supplying an etchant to the catalyst layer to cause an etching of the semiconductor substrate with an assist from the noble metal as a catalyst.
Public/Granted literature
- US20190252199A1 ETCHING METHOD, METHOD OF MANUFACTURING SEMICONDUCTOR CHIP, AND METHOD OF MANUFACTURING ARTICLE Public/Granted day:2019-08-15
Information query
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