Invention Grant
- Patent Title: Method and equipment for performing CMP process
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Application No.: US16919269Application Date: 2020-07-02
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Publication No.: US10854468B2Publication Date: 2020-12-01
- Inventor: Wen-Kuei Liu
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Duane Morris LLP
- Main IPC: H01L21/3105
- IPC: H01L21/3105 ; H01L21/66 ; H01L21/67 ; H01L21/02 ; B24B37/00

Abstract:
A chemical-mechanical planarization device and a method for using a chemical-mechanical planarization device in conjunction with a semiconductor substrate is provided. In accordance with some embodiments, the device includes: a pad disposed over a rotatable platen; a carrier head disposed over the pad and configured to retain a semiconductor substrate between the pad and the carrier head; a tank configured to retain a liquid containing composition; at least one tube fluidly coupled with the tank, the at least one tube comprising a photocatalyst therein; a nozzle fluidly coupled with the tank through the at least one tube and configured to supply the liquid containing composition onto the pad; and a light source configured to provide light to irradiate the photocatalyst, and the liquid containing composition passing through the at least one tube.
Public/Granted literature
- US20200335350A1 METHOD AND EQUIPMENT FOR PERFORMING CMP PROCESS Public/Granted day:2020-10-22
Information query
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