A stacked III-V semiconductor diode having an n− layer having a first surface, a second surface, a dopant concentration of 1012 N/cm3 to 1017 N/cm3 and a layer thickness of 50 μm to 1,000 μm, a p+ layer, which is integrally connected to the first surface and has a dopant concentration of 5·1018 N/cm3 to 5·1020 N/cm3, an n+ layer, which is integrally connected to the second surface and has a dopant concentration of at least 1019 N/cm3. The p+ layer, the n− layer and the n+ layer each having a monolithic design and each being made up of a GaAs compound. The dopant concentration of the n− layer having a first value on the first surface and a second value on the second surface, and the second value of the dopant concentration being greater than the first value at least by a factor between 1.5 and 2.5.