- Patent Title: Method and system to separate optically measured coupled parameters
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Application No.: US14810919Application Date: 2015-07-28
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Publication No.: US10854932B2Publication Date: 2020-12-01
- Inventor: Anurag Ganguli , Julian Schwartz , Ajay Raghavan , Peter Kiesel , Bhaskar Saha , Saroj Sahu , Lars Wilko Sommer
- Applicant: Palo Alto Research Center Incorporated
- Applicant Address: US CA Palo Alto
- Assignee: Palo Alto Research Center Incorporated
- Current Assignee: Palo Alto Research Center Incorporated
- Current Assignee Address: US CA Palo Alto
- Agency: Mueting Raasch Group
- Main IPC: H01M10/42
- IPC: H01M10/42 ; H01M10/48 ; G01L1/24 ; G01R31/392 ; G01D3/036 ; G01D5/353

Abstract:
A system includes a first optical sensor sensitive to both a parameter of interest, Parameter1, and at least one confounding parameter, Parameter2 and a second optical sensor sensitive only to the confounding parameter. Measurement circuitry measures M1 in response to light scattered by the first optical sensor, where M1=value of Parameter1+K*value of Parameter2. The measurement circuitry also measures M2 in response to light scattered by the second optical sensor, where M2=value of Parameter2. Compensation circuitry determines a compensation factor, K, for the confounding parameter based on measurements of M1 and M2 taken over multiple load/unload cycles or over one or more thermal cycles. The compensation factor is used to determine the parameter of interest.
Public/Granted literature
- US20170033414A1 METHOD AND SYSTEM TO SEPARATE OPTICALLY MEASURED COUPLED PARAMETERS Public/Granted day:2017-02-02
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