Invention Grant
- Patent Title: Surface refractive index measurement method and surface stress measurement method using the same
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Application No.: US16020195Application Date: 2018-06-27
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Publication No.: US10859452B2Publication Date: 2020-12-08
- Inventor: Shuji Orihara , Yoshio Orihara , Satoshi Ogami
- Applicant: ORIHARA INDUSTRIAL CO., LTD. , AGC Inc.
- Applicant Address: JP Toshima JP Chiyoda
- Assignee: ORIHARA INDUSTRIAL CO., LTD.,AGC Inc.
- Current Assignee: ORIHARA INDUSTRIAL CO., LTD.,AGC Inc.
- Current Assignee Address: JP Toshima JP Chiyoda
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2015-256395 20151228
- Main IPC: G01L1/24
- IPC: G01L1/24 ; G01N21/41 ; G01N21/43 ; G01B11/16

Abstract:
Disclosed is a method of measuring a surface refractive index of a strengthened glass including causing light to enter a surface layer of the strengthened glass through a liquid provided with a refractive index equivalent to that of a surface of the surface layer; a process of causing the light to be emitted from the strengthened glass through the liquid; converting two types of light components into two types of emission line sequences; capturing an image of the two types of emission line sequences; measuring positions of respective emission lines of the two types of emission line sequences from the image; and calculating refractive indexes of a surface of the strengthened glass corresponding to the two types of light components, or refractive index distributions of the strengthened glass in a depth direction from the surface corresponding to the two types of light components.
Public/Granted literature
- US20180306658A1 SURFACE REFRACTIVE INDEX MEASUREMENT METHOD AND SURFACE STRESS MEASUREMENT METHOD USING THE SAME Public/Granted day:2018-10-25
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