Invention Grant
- Patent Title: Transmittance measuring method, device and computer readable storage medium
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Application No.: US16241121Application Date: 2019-01-07
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Publication No.: US10859494B2Publication Date: 2020-12-08
- Inventor: Yang He
- Applicant: Chongqing HKC Optoelectronics Technology Co., Ltd. , HKC Corporation Limited
- Applicant Address: CN Chongqing CN Shenzhen
- Assignee: Chongqing HKC Optoelectronics Technology Co., Ltd.,HKC Corporation Limited
- Current Assignee: Chongqing HKC Optoelectronics Technology Co., Ltd.,HKC Corporation Limited
- Current Assignee Address: CN Chongqing CN Shenzhen
- Priority: CN201811024525 20180903
- Main IPC: G01N21/59
- IPC: G01N21/59 ; G02F1/1335 ; G02F1/13357
Abstract:
Disclosed are a transmittance measuring method, which includes the following operations: acquiring the initial transmittance of a polarizer to be measured at a measuring point; acquiring a transmittance correction value corresponding to the measuring point; determining the transmittance of the polarizer to be measured according to the initial transmittance and the transmittance correction value corresponding to the measuring point.
Public/Granted literature
- US20200072749A1 Transmittance Measuring Method, Device and Computer Readable Storage Medium Public/Granted day:2020-03-05
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