Invention Grant
- Patent Title: X-ray phase contrast imaging apparatus
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Application No.: US16309820Application Date: 2017-03-15
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Publication No.: US10859512B2Publication Date: 2020-12-08
- Inventor: Koichi Tanabe , Toshinori Yoshimuta , Kenji Kimura , Hiroyuki Kishihara , Yukihisa Wada , Takuro Izumi , Taro Shirai , Takahiro Doki , Satoshi Sano , Akira Horiba
- Applicant: Shimadzu Corporation
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Muir Patent Law, PLLC
- Priority: JP2016-118933 20160615
- International Application: PCT/JP2017/010511 WO 20170315
- International Announcement: WO2017/217049 WO 20171221
- Main IPC: G01N23/041
- IPC: G01N23/041 ; A61B6/00 ; G01N23/046 ; G01N23/044

Abstract:
Provided is a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject. According to the present invention, it is possible to provide a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject immediately before. That is, the apparatus of the present invention is provided with a phase grating 5 provided with a subject area and a reference area. Both areas each have a predetermined pattern that absorbs radiation, but the patterns are different from each other. In this area, an image of the phase grating 5 is observed in a moire pattern of a long period. This moire image of a long period changes in the positions due to the minute change in the relative position between the phase grating 5 and the absorption grating 6, so it becomes possible to detect the minute change of the relative position between the radiation source, the phase grating 5, and the absorption grating 6 from the image of the reference area.
Public/Granted literature
- US20190175126A1 RADIATION IMAGING APPARATUS Public/Granted day:2019-06-13
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