Invention Grant
- Patent Title: Test selection for application commit
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Application No.: US15455964Application Date: 2017-03-10
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Publication No.: US10860464B2Publication Date: 2020-12-08
- Inventor: Shaul Strachan , Sigal Ishay
- Applicant: Hewlett Packard Enterprise Development LP
- Applicant Address: US CA Santa Clara
- Assignee: MICRO FOCUS LLC
- Current Assignee: MICRO FOCUS LLC
- Current Assignee Address: US CA Santa Clara
- Main IPC: G06F11/36
- IPC: G06F11/36 ; G06F8/71

Abstract:
Examples disclosed herein involve selecting tests for an application commit. In examples herein, a commit of an application code is detected based on a commit identifier in a request, the commit to update the application code, characteristics of the commit are determined from a repository of commit records; and tests for the commit are selected based on the characteristics of the application code to be executed to validate the updated application code.
Public/Granted literature
- US20180260312A1 TEST SELECTION FOR APPLICATION COMMIT Public/Granted day:2018-09-13
Information query