Invention Grant
- Patent Title: Learning-based correction of grid artifacts in X-ray imaging
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Application No.: US16785598Application Date: 2020-02-08
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Publication No.: US10861155B2Publication Date: 2020-12-08
- Inventor: Philipp Bernhardt , Boris Stowasser
- Applicant: Siemens Healthcare GmbH
- Applicant Address: DE Erlangen
- Assignee: Siemens Healthcare GmbH
- Current Assignee: Siemens Healthcare GmbH
- Current Assignee Address: DE Erlangen
- Agency: Lempia Summerfield Katz LLC
- Priority: EP19156195 20190208
- Main IPC: A61B6/00
- IPC: A61B6/00 ; G06T7/00 ; G16H30/40 ; G06N20/00 ; G01N23/04

Abstract:
A method for training a function of an X-ray system that has a positioning mechanism such as a C-arm, a detector, and, in a beam path in front of the detector, an anti-scatter grid. Positioning of the detector at a large number of different positions occurs. The positioning mechanism is deflected and/or distorted. Recording of at least one X-ray photograph in each of the positions then takes place, and the method further includes machine learning of artifacts generated by the anti-scatter grid from all X-ray photographs for the function.
Public/Granted literature
- US20200258222A1 LEARNING-BASED CORRECTION OF GRID ARTIFACTS IN X-RAY IMAGING Public/Granted day:2020-08-13
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