Invention Grant
- Patent Title: Image inspecting apparatus, image inspecting method and image inspecting program
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Application No.: US16219901Application Date: 2018-12-13
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Publication No.: US10861179B2Publication Date: 2020-12-08
- Inventor: Yutaka Kato
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: JCIPRNET
- Priority: JP2018-039347 20180306
- Main IPC: G06T7/60
- IPC: G06T7/60 ; G06T7/70 ; G01N21/95 ; G01B11/25 ; G01N21/88

Abstract:
An image inspecting apparatus for inspecting an object under inspection by using an image, including: a lighting part which irradiates the object under inspection with light; an image capturing part which captures an image of the object under inspection; and a control part which causes the lighting part to irradiate pattern light in a shape that is created based on a positional relationship between the lighting part and the image capturing part and shape data of the object under inspection and that in a case where the lighting part irradiates light, a shape of the light of the lighting part photographed in the image captured by the image capturing part matches a predetermined pattern, is provided.
Public/Granted literature
- US20190279388A1 IMAGE INSPECTING APPARATUS, IMAGE INSPECTING METHOD AND IMAGE INSPECTING PROGRAM Public/Granted day:2019-09-12
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