Invention Grant
- Patent Title: Method of preparing IGZO thin film transistor
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Application No.: US15749492Application Date: 2018-01-04
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Publication No.: US10861883B2Publication Date: 2020-12-08
- Inventor: Qiming Gan
- Applicant: SHENZHEN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
- Applicant Address: CN Shenzhen
- Assignee: SHENZHEN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
- Current Assignee: SHENZHEN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Shenzhen
- Agency: Hemisphere Law, PLLC
- Agent Zhigang Ma
- Priority: CN201711444804 20171227
- International Application: PCT/CN2018/071379 WO 20180104
- International Announcement: WO2019/127634 WO 20190704
- Main IPC: H01L27/12
- IPC: H01L27/12 ; H01L29/66 ; H01L29/786

Abstract:
A method of preparing IGZO thin film transistor is provided. The method includes. step S1, using a first mask on a first metal layer to form a grid electrode, and sequentially forming grid insulating layer, IGZO semiconducting layer and second metal layer on grid electrode; step S2, coating photoresist layer on second metal layer, and exposure developing photoresist layer by second mask, and simultaneously etching second metal layer and IGZO semiconducting layer by hydrogen peroxide, and second metal layer is formed to source electrode and drain electrode by etching; step S3, forming passivation layer on source electrode and drain electrode, and forming a via hole above drain electrode by third mask; step S4, forming pixel electrode on passivation layer by fourth mask, and pixel electrode is connecting to drain electrode by via hole.
Public/Granted literature
- US20200295058A1 METHOD OF PREPARING IGZO THIN FILM TRANSISTOR Public/Granted day:2020-09-17
Information query
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