Invention Grant
- Patent Title: Method for imaging 1-D nanomaterials
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Application No.: US16116046Application Date: 2018-08-29
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Publication No.: US10883917B2Publication Date: 2021-01-05
- Inventor: Wen-Yun Wu , Dong-Qi Li , Jin Zhang , Kai-Li Jiang , Shou-Shan Fan
- Applicant: Tsinghua University , HON HAI PRECISION INDUSTRY CO., LTD.
- Applicant Address: CN Beijing; TW New Taipei
- Assignee: Tsinghua University,HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee: Tsinghua University,HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee Address: CN Beijing; TW New Taipei
- Agency: ScienBiziP, P.C.
- Priority: CN201710773546 20170831
- Main IPC: G01N15/14
- IPC: G01N15/14 ; G01N21/65 ; G01N21/51 ; G01N21/25 ; G01N15/00 ; G02B21/36 ; G02B21/10 ; G02B21/00

Abstract:
A method for imaging 1-D nanomaterials is provided. The method includes: providing a 1-D nanomaterials sample; immersing the 1-D nanomaterials sample in a liquid; illuminating the 1-D nanomaterials sample by a first incident light and a second incident light to cause resonance Rayleigh scattering, wherein the first incident light and the second incident light are not parallel to each other; and acquiring a resonance Rayleigh scattering image of the 1-D nanomaterials sample with a microscope.
Public/Granted literature
- US20190064050A1 METHOD FOR IMAGING 1-D NANOMATERIALS Public/Granted day:2019-02-28
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