Invention Grant
- Patent Title: Structure evaluation system and structure evaluation method
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Application No.: US15918549Application Date: 2018-03-12
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Publication No.: US10883919B2Publication Date: 2021-01-05
- Inventor: Hidefumi Takamine , Kazuo Watabe , Tomoki Shiotani , Takahiro Nishida
- Applicant: Kabushiki Kaisha Toshiba , Kyoto University
- Applicant Address: JP Minato-ku; JP Kyoto
- Assignee: Kabushiki Kaisha Toshiba,Kyoto University
- Current Assignee: Kabushiki Kaisha Toshiba,Kyoto University
- Current Assignee Address: JP Minato-ku; JP Kyoto
- Agency: Obion, McClelland, Maier & Neustadt, L.L.P.
- Main IPC: G01N19/08
- IPC: G01N19/08 ; G01M99/00 ; G01N29/04 ; G01H1/12 ; G01M5/00 ; G01M7/08

Abstract:
According to one embodiment, a structure evaluation system includes an impact imparting unit, a sensor, and a structure evaluation device. The impact imparting unit applies impacts to a structure. The impact imparting unit applies the impacts at a frequency equal to or less than a frequency determined in accordance with an intensity at which the impacts are imparted. The sensor detects elastic waves. The structure evaluation device evaluates a deterioration state of the structure on the basis of the detected elastic waves.
Public/Granted literature
- US20180372580A1 STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD Public/Granted day:2018-12-27
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