Invention Grant
- Patent Title: Vertical probe card
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Application No.: US16314902Application Date: 2017-11-06
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Publication No.: US10884026B2Publication Date: 2021-01-05
- Inventor: Yuanjun Shi , Kai Liu
- Applicant: TWINSOLUTION TECHNOLOGY (SUZHOU) LTD
- Applicant Address: CN Jiangsu
- Assignee: TWINSOLUTION TECHNOLOGY (SUZHOU) LTD
- Current Assignee: TWINSOLUTION TECHNOLOGY (SUZHOU) LTD
- Current Assignee Address: CN Jiangsu
- Agency: Schmeiser, Olsen & Watts, LLP
- Priority: CN201710352127 20170518
- International Application: PCT/CN2017/109587 WO 20171106
- International Announcement: WO2018/209901 WO 20181122
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R1/073 ; H05K1/11 ; G01R1/067 ; H05K1/18 ; G01R31/28 ; G01R3/00 ; G01R1/04 ; G01R31/26

Abstract:
Provided is a vertical probe card, the vertical probe card includes: a printed circuit board (PCB) including a bottom hole and a PCB pad surrounding the bottom hole; a cover plate disposed on the PCB and including a cover hole, where the cover hole and the bottom hole are disposed coaxial with each other and form a receiving space; and a probe received in the receiving space. The probe includes a probe head passing through the cover hole to extend out of the cover plate and to contact with a chip, where an end, which is provided with the probe head, of the probe is a first end; and a protruding portion disposed in the mid-portion of the probe and in contact with the PCB pad, where a part between the probe head and the protruding portion of the probe and the protruding portion are conductors.
Public/Granted literature
- US20190250190A1 VERTICAL PROBE CARD Public/Granted day:2019-08-15
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