Invention Grant
- Patent Title: Inspection assistance device, inspection assistance method, and program
-
Application No.: US16335353Application Date: 2016-10-19
-
Publication No.: US10884615B2Publication Date: 2021-01-05
- Inventor: Koki Tateishi , Makoto Tanaka , Tadakuni Nishio , Ichiro Saito
- Applicant: Mitsubishi Hitachi Power Systems, Ltd.
- Applicant Address: JP Kanagawa
- Assignee: Mitsubishi Hitachi Power Systems, Ltd.
- Current Assignee: Mitsubishi Hitachi Power Systems, Ltd.
- Current Assignee Address: JP Kanagawa
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- International Application: PCT/JP2016/080932 WO 20161019
- International Announcement: WO2018/073908 WO 20180426
- Main IPC: G06Q10/00
- IPC: G06Q10/00 ; G06F3/0488 ; G01N21/88 ; G05B23/02 ; G06F3/041 ; F01D25/00 ; G01N21/84

Abstract:
An inspection assistance device includes a damage drawing input part configured to input a damage drawing, i.e. a drawing illustrating damages of target parts, a display configured to display the damage drawing and target figures illustrating target parts to be overlaid with each other, and a storage configured to store the damage drawing separately from the target figures in connection with the target figures.
Public/Granted literature
- US20190258394A1 INSPECTION ASSISTANCE DEVICE, INSPECTION ASSISTANCE METHOD, AND PROGRAM Public/Granted day:2019-08-22
Information query