Invention Grant
- Patent Title: System for characterization of biometric station metrics
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Application No.: US16366226Application Date: 2019-03-27
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Publication No.: US10885364B2Publication Date: 2021-01-05
- Inventor: Arun Vemury
- Applicant: The Government of the United States of America, as represented by the Secretary of Homeland Security
- Applicant Address: US DC Washington
- Assignee: The Government of the United States of America, as represented by the Secretary of Homeland Security
- Current Assignee: The Government of the United States of America, as represented by the Secretary of Homeland Security
- Current Assignee Address: US DC Washington
- Agent Lavanya Ratnam; Kelly G. Hyndman
- Main IPC: G06K9/03
- IPC: G06K9/03 ; G06K9/62 ; G06K9/00

Abstract:
Various example implementations of the present invention are directed towards systems and methods to quantify biometric acquisition and identification. A test facility evaluates the acquisition by a biometric station of biometric information. Evaluations can relate to biometric information acquisition speed, rates of acquisition failure, rates of biometric information extraction failure, rates of biometric match failure, calculating a true identification rate, and/or calculating other metrics related to quantifying biometric acquisition and identification. The test facility can calculate an efficiency metric and an effectiveness metric of the quantification determinations, and output such results.
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