Invention Grant
- Patent Title: Inspection apparatus, data generation apparatus, data generation method, and data generation program
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Application No.: US16129129Application Date: 2018-09-12
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Publication No.: US10885618B2Publication Date: 2021-01-05
- Inventor: Yuki Hanzawa , Masashi Kurita
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: Metrolex IP Law Group, PLLC
- Priority: JP2017-214945 20171107
- Main IPC: G06N3/08
- IPC: G06N3/08 ; G06T7/00 ; G06K9/62 ; G06T7/11 ; G06K9/00

Abstract:
An inspection apparatus includes: an image capturing apparatus configured to capture an image of an object to be inspected: a determination unit configured to determine, based on the image, whether or not the object to be inspected includes a defect, using an identification device that has been trained using learning data: an input unit configured to accept an input indicating whether or not a determination result by the determination unit is correct; an extraction unit configured to extract a partial image of the image based on which the determination has been made; and a generation unit configured to generate new learning data based on the partial image, if a fact that the determination result by the determination unit is not correct has been input.
Public/Granted literature
- US20190139212A1 INSPECTION APPARATUS, DATA GENERATION APPARATUS, DATA GENERATION METHOD, AND DATA GENERATION PROGRAM Public/Granted day:2019-05-09
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