Invention Grant
- Patent Title: Analysis apparatus and analysis method
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Application No.: US16057902Application Date: 2018-08-08
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Publication No.: US10885665B2Publication Date: 2021-01-05
- Inventor: Shigeki Masuda , Yukio Watanabe
- Applicant: ARKRAY, Inc.
- Applicant Address: JP Kyoto
- Assignee: ARKRAY, Inc.
- Current Assignee: ARKRAY, Inc.
- Current Assignee Address: JP Kyoto
- Agency: Studebaker & Brackett PC
- Priority: JP2017-155421 20170810,JP2018-099790 20180524
- Main IPC: G06T7/73
- IPC: G06T7/73 ; G01N15/14

Abstract:
Detection and analysis of a tangible component in a sample are implemented at lower cost. Provided is an analysis apparatus including a flow cell which includes a flow path for a sample, a branch section configured to cause light having passed through the flow path to branch at least to a first optical path and a second optical path, a first imaging section and a second imaging section configured to capture images of the sample in the flow path by using the light in the first optical path and the light in the second optical path, and a controller configured to process the captured images. The first imaging section and the second imaging section capture images that have the same angle of view but have different characteristics.
Public/Granted literature
- US20190051011A1 ANALYSIS APPARATUS AND ANALYSIS METHOD Public/Granted day:2019-02-14
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