Invention Grant
- Patent Title: Magnetoresistance effect device with shaped high-frequency signal line overlapping magnetoresistance effect element
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Application No.: US16364534Application Date: 2019-03-26
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Publication No.: US10885934B2Publication Date: 2021-01-05
- Inventor: Naomichi Degawa , Tsuyoshi Suzuki
- Applicant: TDK CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TDK CORPORATION
- Current Assignee: TDK CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2018-069964 20180330
- Main IPC: G11B5/39
- IPC: G11B5/39 ; G01R33/09 ; H01L43/08 ; H01L43/10 ; H03H9/22 ; H01F10/32 ; H01L43/02 ; G11B5/31 ; B82Y25/00

Abstract:
Provided is a magnetoresistance effect device comprising a magnetoresistance effect element including a first ferromagnetic layer, a second ferromagnetic layer and a spacer layer, and a high-frequency signal line. The high-frequency signal line includes an overlapping part disposed at a position overlapping the magnetoresistance effect element and a non-overlapping part disposed at a position not overlapping the magnetoresistance effect element in a plan view from a stacking direction. At least a part of the non-overlapping part is disposed below the overlapping part in the stacking direction, assuming that the overlapping part is above the magnetoresistance effect element in the stacking direction.
Public/Granted literature
- US20190304491A1 MAGNETORESISTANCE EFFECT DEVICE Public/Granted day:2019-10-03
Information query
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