Invention Grant
- Patent Title: Semiconductor-product testing device, method for testing semiconductor product, and semiconductor product
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Application No.: US16361939Application Date: 2019-03-22
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Publication No.: US10886001B2Publication Date: 2021-01-05
- Inventor: Naoki Yamada , Yoshiyuki Matsumoto , Kazuhiro Nishimura
- Applicant: RENESAS ELECTRONICS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: RENESAS ELECTRONICS CORPORATION
- Current Assignee: RENESAS ELECTRONICS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2018-075000 20180409
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C29/38 ; G11C29/36
Abstract:
A semiconductor-product testing device that supplies a test pattern for testing a semiconductor product to the semiconductor product includes a pattern memory that stores a part of the test pattern. The pattern memory is rewritten during a time when the semiconductor product is tested by a part of the test pattern stored in the pattern memory included in the semiconductor-product testing device.
Public/Granted literature
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